SN74LVTH18502APMG4

Texas Instruments
  • Lifecycle status Active
  • RoHS RoHS Compliant
  • DescriptionIC SCAN-TEST-DEV/XCVR 64-LQFP
  • CategoryLogic - Specialty Logic
  • ECAD Model
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In Stock: 182

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Technical Details

  • Series:74LVTH
  • Package:Tray
  • Part Status:Obsolete
  • Logic Type:ABT Scan Test Device With Universal Bus Transceivers
  • Supply Voltage:2.7V ~ 3.6V

 

  • Number of Bits:18
  • Operating Temperature:-40°C ~ 85°C
  • Mounting Type:Surface Mount
  • Package / Case:64-LQFP
  • Supplier Device Package:64-LQFP (10x10)

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